Three-dimensional surface topography of graphene by divergent beam electron diffraction
Graphene, and other 2D materials, do not exist as strictly planar sheets but instead have topographic ripples on the sub-nanometre scale. Here, Latychevskaiaet al. present a method to non-invasively image ripples in 2D materials with a single-shot, wide-area, electron diffraction measurement.
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| Autores principales: | , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2017
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/6e636494d1c64a7b8bffc4979e808531 |
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