Three-dimensional surface topography of graphene by divergent beam electron diffraction
Graphene, and other 2D materials, do not exist as strictly planar sheets but instead have topographic ripples on the sub-nanometre scale. Here, Latychevskaiaet al. present a method to non-invasively image ripples in 2D materials with a single-shot, wide-area, electron diffraction measurement.
Guardado en:
Autores principales: | Tatiana Latychevskaia, Wei-Hao Hsu, Wei-Tse Chang, Chun-Yueh Lin, Ing-Shouh Hwang |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2017
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Materias: | |
Acceso en línea: | https://doaj.org/article/6e636494d1c64a7b8bffc4979e808531 |
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