Three-dimensional surface topography of graphene by divergent beam electron diffraction

Graphene, and other 2D materials, do not exist as strictly planar sheets but instead have topographic ripples on the sub-nanometre scale. Here, Latychevskaiaet al. present a method to non-invasively image ripples in 2D materials with a single-shot, wide-area, electron diffraction measurement.

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Autores principales: Tatiana Latychevskaia, Wei-Hao Hsu, Wei-Tse Chang, Chun-Yueh Lin, Ing-Shouh Hwang
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/6e636494d1c64a7b8bffc4979e808531
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