Three-dimensional surface topography of graphene by divergent beam electron diffraction
Graphene, and other 2D materials, do not exist as strictly planar sheets but instead have topographic ripples on the sub-nanometre scale. Here, Latychevskaiaet al. present a method to non-invasively image ripples in 2D materials with a single-shot, wide-area, electron diffraction measurement.
Enregistré dans:
Auteurs principaux: | Tatiana Latychevskaia, Wei-Hao Hsu, Wei-Tse Chang, Chun-Yueh Lin, Ing-Shouh Hwang |
---|---|
Format: | article |
Langue: | EN |
Publié: |
Nature Portfolio
2017
|
Sujets: | |
Accès en ligne: | https://doaj.org/article/6e636494d1c64a7b8bffc4979e808531 |
Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|
Documents similaires
-
Non-diffracting multi-electron vortex beams balancing their electron–electron interactions
par: Maor Mutzafi, et autres
Publié: (2017) -
Atomic layer etching of graphene through controlled ion beam for graphene-based electronics
par: Ki Seok Kim, et autres
Publié: (2017) -
Fabrication of three-dimensional suspended, interlayered and hierarchical nanostructures by accuracy-improved electron beam lithography overlay
par: Gwanho Yoon, et autres
Publié: (2017) -
Diffractive photonic applications mediated by laser reduced graphene oxides
par: Wang Sicong, et autres
Publié: (2018) -
Three-dimensional X-ray diffraction imaging of dislocations in polycrystalline metals under tensile loading
par: Mathew J. Cherukara, et autres
Publié: (2018)