Damage of single-wall carbon nanotube network structure under electric current loading

Carbon nanotubes (CNTs) are highly resistant to deformation, and their electrical characteristics are also resistant to degradation at ambient conditions. The damage mechanisms of CNT loaded under high current density are considered to be the oxidation by Joule heating and migration of carbon atoms...

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Auteurs principaux: Shunsuke SATO, Kazuhiro FUJISAKI, Kazuhiko SASAGAWA
Format: article
Langue:EN
Publié: The Japan Society of Mechanical Engineers 2016
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Accès en ligne:https://doaj.org/article/6f7585683d0c4145971bc2f48ab1e019
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