Damage of single-wall carbon nanotube network structure under electric current loading

Carbon nanotubes (CNTs) are highly resistant to deformation, and their electrical characteristics are also resistant to degradation at ambient conditions. The damage mechanisms of CNT loaded under high current density are considered to be the oxidation by Joule heating and migration of carbon atoms...

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Autores principales:	Shunsuke SATO, Kazuhiro FUJISAKI, Kazuhiko SASAGAWA
Formato:	article
Lenguaje:	EN
Publicado:	The Japan Society of Mechanical Engineers 2016
Materias:	carbon nanotube current loading high current density damage photolithography Mechanical engineering and machinery TJ1-1570
Acceso en línea:	https://doaj.org/article/6f7585683d0c4145971bc2f48ab1e019
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spelling	oai:doaj.org-article:6f7585683d0c4145971bc2f48ab1e0192021-11-26T06:58:32ZDamage of single-wall carbon nanotube network structure under electric current loading2187-974510.1299/mej.16-00292https://doaj.org/article/6f7585683d0c4145971bc2f48ab1e0192016-10-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/mej/3/6/3_16-00292/_pdf/-char/enhttps://doaj.org/toc/2187-9745Carbon nanotubes (CNTs) are highly resistant to deformation, and their electrical characteristics are also resistant to degradation at ambient conditions. The damage mechanisms of CNT loaded under high current density are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, the damage characteristics of single-wall CNT (SWCNT) network structures were investigated under accelerated condition with high current loading and heating. The semiconducting and metallic SWCNT network structure specimens of straight shape with 10 μm in width, and 50 μm or 100 μm in length were fabricated by means of photolithographic technique. A testing system applying high current density was constructed and accelerated tests of SWCNT specimens were conducted in the system. The changes of potential drop among the specimen under the constant current loading were recorded until damage occurrence in the SWCNT network structure. The damage characteristics of the specimens were discussed from the changes of microscopic structure and electric resistance under the different accelerated conditions. The disconnection of SWCNT structure was occurred at the cathode and center area of the straight shaped specimen and these were observed in three dimensional laser microscope and SEM images after current loading. There were two mechanisms based on oxidation of Joule heating and electromigration occurred in the SWCNT specimens under high density current loading.Shunsuke SATOKazuhiro FUJISAKIKazuhiko SASAGAWAThe Japan Society of Mechanical Engineersarticlecarbon nanotubecurrent loadinghigh current densitydamagephotolithographyMechanical engineering and machineryTJ1-1570ENMechanical Engineering Journal, Vol 3, Iss 6, Pp 16-00292-16-00292 (2016)
institution	DOAJ
collection	DOAJ
language	EN
topic	carbon nanotube current loading high current density damage photolithography Mechanical engineering and machinery TJ1-1570
spellingShingle	carbon nanotube current loading high current density damage photolithography Mechanical engineering and machinery TJ1-1570 Shunsuke SATO Kazuhiro FUJISAKI Kazuhiko SASAGAWA Damage of single-wall carbon nanotube network structure under electric current loading
description	Carbon nanotubes (CNTs) are highly resistant to deformation, and their electrical characteristics are also resistant to degradation at ambient conditions. The damage mechanisms of CNT loaded under high current density are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, the damage characteristics of single-wall CNT (SWCNT) network structures were investigated under accelerated condition with high current loading and heating. The semiconducting and metallic SWCNT network structure specimens of straight shape with 10 μm in width, and 50 μm or 100 μm in length were fabricated by means of photolithographic technique. A testing system applying high current density was constructed and accelerated tests of SWCNT specimens were conducted in the system. The changes of potential drop among the specimen under the constant current loading were recorded until damage occurrence in the SWCNT network structure. The damage characteristics of the specimens were discussed from the changes of microscopic structure and electric resistance under the different accelerated conditions. The disconnection of SWCNT structure was occurred at the cathode and center area of the straight shaped specimen and these were observed in three dimensional laser microscope and SEM images after current loading. There were two mechanisms based on oxidation of Joule heating and electromigration occurred in the SWCNT specimens under high density current loading.
format	article
author	Shunsuke SATO Kazuhiro FUJISAKI Kazuhiko SASAGAWA
author_facet	Shunsuke SATO Kazuhiro FUJISAKI Kazuhiko SASAGAWA
author_sort	Shunsuke SATO
title	Damage of single-wall carbon nanotube network structure under electric current loading
title_short	Damage of single-wall carbon nanotube network structure under electric current loading
title_full	Damage of single-wall carbon nanotube network structure under electric current loading
title_fullStr	Damage of single-wall carbon nanotube network structure under electric current loading
title_full_unstemmed	Damage of single-wall carbon nanotube network structure under electric current loading
title_sort	damage of single-wall carbon nanotube network structure under electric current loading
publisher	The Japan Society of Mechanical Engineers
publishDate	2016
url	https://doaj.org/article/6f7585683d0c4145971bc2f48ab1e019
work_keys_str_mv	AT shunsukesato damageofsinglewallcarbonnanotubenetworkstructureunderelectriccurrentloading AT kazuhirofujisaki damageofsinglewallcarbonnanotubenetworkstructureunderelectriccurrentloading AT kazuhikosasagawa damageofsinglewallcarbonnanotubenetworkstructureunderelectriccurrentloading
_version_	1718409724116860928

Damage of single-wall carbon nanotube network structure under electric current loading

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