Understanding degradation of organic light-emitting diodes from magnetic field effects

Improving the lifetime of organic light-emitting diodes requires that degradation processes are understood. Here it is demonstrated that magnetic field effects can be used as a non-destructive indicator of device degradation.

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Masaki Tanaka, Ryo Nagata, Hajime Nakanotani, Chihaya Adachi
Format: article
Langue:EN
Publié: Nature Portfolio 2020
Sujets:
Accès en ligne:https://doaj.org/article/75d61c158cbc4bec977bcea535803d12
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!