Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films

To enable the production of sophisticated optical interference coating designs, coatings with very low absorption and stray light losses and excellent layer thickness deposition accuracy are required. The selection and optimization of suitable coating materials and deposition processes are consequen...

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Autores principales: Bärtschi Manuel, Schachtler Daniel, Schwyn-Thöny Silvia, Südmeyer Thomas, Botha Roelene
Formato: article
Lenguaje:EN
Publicado: EDP Sciences 2021
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Acceso en línea:https://doaj.org/article/7628a529ba534d1b9e2ff13e8c6aad37
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spelling oai:doaj.org-article:7628a529ba534d1b9e2ff13e8c6aad372021-12-02T17:12:51ZInvestigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films2100-014X10.1051/epjconf/202125503005https://doaj.org/article/7628a529ba534d1b9e2ff13e8c6aad372021-01-01T00:00:00Zhttps://www.epj-conferences.org/articles/epjconf/pdf/2021/09/epjconf_eosam2021_03005.pdfhttps://doaj.org/toc/2100-014XTo enable the production of sophisticated optical interference coating designs, coatings with very low absorption and stray light losses and excellent layer thickness deposition accuracy are required. The selection and optimization of suitable coating materials and deposition processes are consequently essential. This study investigated the influence of the plasma source power on the optical properties, layer uniformity and stress, scattered light behavior and optical losses of magnetron sputtered Ta2O5 thin films.Bärtschi ManuelSchachtler DanielSchwyn-Thöny SilviaSüdmeyer ThomasBotha RoeleneEDP SciencesarticlePhysicsQC1-999ENEPJ Web of Conferences, Vol 255, p 03005 (2021)
institution DOAJ
collection DOAJ
language EN
topic Physics
QC1-999
spellingShingle Physics
QC1-999
Bärtschi Manuel
Schachtler Daniel
Schwyn-Thöny Silvia
Südmeyer Thomas
Botha Roelene
Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films
description To enable the production of sophisticated optical interference coating designs, coatings with very low absorption and stray light losses and excellent layer thickness deposition accuracy are required. The selection and optimization of suitable coating materials and deposition processes are consequently essential. This study investigated the influence of the plasma source power on the optical properties, layer uniformity and stress, scattered light behavior and optical losses of magnetron sputtered Ta2O5 thin films.
format article
author Bärtschi Manuel
Schachtler Daniel
Schwyn-Thöny Silvia
Südmeyer Thomas
Botha Roelene
author_facet Bärtschi Manuel
Schachtler Daniel
Schwyn-Thöny Silvia
Südmeyer Thomas
Botha Roelene
author_sort Bärtschi Manuel
title Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films
title_short Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films
title_full Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films
title_fullStr Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films
title_full_unstemmed Investigation of the influence of plasma source power on the properties of magnetron sputtered Ta2O5 thin films
title_sort investigation of the influence of plasma source power on the properties of magnetron sputtered ta2o5 thin films
publisher EDP Sciences
publishDate 2021
url https://doaj.org/article/7628a529ba534d1b9e2ff13e8c6aad37
work_keys_str_mv AT bartschimanuel investigationoftheinfluenceofplasmasourcepoweronthepropertiesofmagnetronsputteredta2o5thinfilms
AT schachtlerdaniel investigationoftheinfluenceofplasmasourcepoweronthepropertiesofmagnetronsputteredta2o5thinfilms
AT schwynthonysilvia investigationoftheinfluenceofplasmasourcepoweronthepropertiesofmagnetronsputteredta2o5thinfilms
AT sudmeyerthomas investigationoftheinfluenceofplasmasourcepoweronthepropertiesofmagnetronsputteredta2o5thinfilms
AT botharoelene investigationoftheinfluenceofplasmasourcepoweronthepropertiesofmagnetronsputteredta2o5thinfilms
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