Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy

In this study, a novel method was developed for in situ scanning electron microscopy (SEM) observations of friction interfaces, from a top view, using a Si3N4 thin film (SiN film), which has high electron transmission ability, and a microtribometer. Nanodiamond (ND) aggregates were adsorbed on the b...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Hiroshi Kinoshita, Naohiro Matsumoto
Formato: article
Lenguaje:EN
Publicado: Japanese Society of Tribologists 2019
Materias:
Acceso en línea:https://doaj.org/article/763f7f3d073a426c890340af644f8bfe
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!