Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy

In this study, a novel method was developed for in situ scanning electron microscopy (SEM) observations of friction interfaces, from a top view, using a Si3N4 thin film (SiN film), which has high electron transmission ability, and a microtribometer. Nanodiamond (ND) aggregates were adsorbed on the b...

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Autores principales: Hiroshi Kinoshita, Naohiro Matsumoto
Formato: article
Lenguaje:EN
Publicado: Japanese Society of Tribologists 2019
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Acceso en línea:https://doaj.org/article/763f7f3d073a426c890340af644f8bfe
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spelling oai:doaj.org-article:763f7f3d073a426c890340af644f8bfe2021-11-05T09:17:25ZNovel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy1881-219810.2474/trol.14.382https://doaj.org/article/763f7f3d073a426c890340af644f8bfe2019-12-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/trol/14/5/14_382/_pdf/-char/enhttps://doaj.org/toc/1881-2198In this study, a novel method was developed for in situ scanning electron microscopy (SEM) observations of friction interfaces, from a top view, using a Si3N4 thin film (SiN film), which has high electron transmission ability, and a microtribometer. Nanodiamond (ND) aggregates were adsorbed on the back surface of the SiN film. A JIS-SUS304 ball, on which surface ND aggregates were adsorbed and tribofilms were already formed, contacted and slid with the back surface of the SiN film. An SEM electron beam went through the SiN film, and generated secondary electrons from the ball surface contacting the back surface of the SiN film and the adsorbed ND aggregates. Thereafter, the generated secondary electrons from the ball surface penetrated again through the SiN film and reached the SEM electron detector. In other words, the contacting ball surface and the adsorbed ND aggregates were successfully imaged through the SiN film. Energy dispersive X-ray spectroscopy analyses of the friction interfaces were also accomplished. Moreover, in situ SEM observations of friction interfaces under boundary lubrication, using poly-alpha olefin (PAO) oil with graphene oxide aggregates and lithium grease with MoS2 particles, were successfully accomplished. The PAO oil and lithium grease had electron transmission ability, and the friction interfaces were imaged by SEM as seen with an optical microscope.Hiroshi KinoshitaNaohiro MatsumotoJapanese Society of Tribologistsarticlefriction interfacesboundary lubricationscanning electron microscopyin situ observationcontact surfacesPhysicsQC1-999Engineering (General). Civil engineering (General)TA1-2040Mechanical engineering and machineryTJ1-1570ChemistryQD1-999ENTribology Online, Vol 14, Iss 5, Pp 382-387 (2019)
institution DOAJ
collection DOAJ
language EN
topic friction interfaces
boundary lubrication
scanning electron microscopy
in situ observation
contact surfaces
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
spellingShingle friction interfaces
boundary lubrication
scanning electron microscopy
in situ observation
contact surfaces
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
Hiroshi Kinoshita
Naohiro Matsumoto
Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
description In this study, a novel method was developed for in situ scanning electron microscopy (SEM) observations of friction interfaces, from a top view, using a Si3N4 thin film (SiN film), which has high electron transmission ability, and a microtribometer. Nanodiamond (ND) aggregates were adsorbed on the back surface of the SiN film. A JIS-SUS304 ball, on which surface ND aggregates were adsorbed and tribofilms were already formed, contacted and slid with the back surface of the SiN film. An SEM electron beam went through the SiN film, and generated secondary electrons from the ball surface contacting the back surface of the SiN film and the adsorbed ND aggregates. Thereafter, the generated secondary electrons from the ball surface penetrated again through the SiN film and reached the SEM electron detector. In other words, the contacting ball surface and the adsorbed ND aggregates were successfully imaged through the SiN film. Energy dispersive X-ray spectroscopy analyses of the friction interfaces were also accomplished. Moreover, in situ SEM observations of friction interfaces under boundary lubrication, using poly-alpha olefin (PAO) oil with graphene oxide aggregates and lithium grease with MoS2 particles, were successfully accomplished. The PAO oil and lithium grease had electron transmission ability, and the friction interfaces were imaged by SEM as seen with an optical microscope.
format article
author Hiroshi Kinoshita
Naohiro Matsumoto
author_facet Hiroshi Kinoshita
Naohiro Matsumoto
author_sort Hiroshi Kinoshita
title Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
title_short Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
title_full Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
title_fullStr Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
title_full_unstemmed Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
title_sort novel method for direct observation of friction interfaces between suj2 ball and si3n4 thin film using scanning electron microscopy
publisher Japanese Society of Tribologists
publishDate 2019
url https://doaj.org/article/763f7f3d073a426c890340af644f8bfe
work_keys_str_mv AT hiroshikinoshita novelmethodfordirectobservationoffrictioninterfacesbetweensuj2ballandsi3n4thinfilmusingscanningelectronmicroscopy
AT naohiromatsumoto novelmethodfordirectobservationoffrictioninterfacesbetweensuj2ballandsi3n4thinfilmusingscanningelectronmicroscopy
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