Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy
In this study, a novel method was developed for in situ scanning electron microscopy (SEM) observations of friction interfaces, from a top view, using a Si3N4 thin film (SiN film), which has high electron transmission ability, and a microtribometer. Nanodiamond (ND) aggregates were adsorbed on the b...
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Autores principales: | Hiroshi Kinoshita, Naohiro Matsumoto |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Japanese Society of Tribologists
2019
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Materias: | |
Acceso en línea: | https://doaj.org/article/763f7f3d073a426c890340af644f8bfe |
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