Hot electrons in a nanowire hard X-ray detector

Designing efficient nanowire chip-based electrical and optical devices remains a challenge. Here, the authors present an axial p-n junction GaAs nanowire X-ray detector that enables achieving a spatial resolution of 200 nm; probing the internal electrical field and observing hot electron effects at...

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Bibliographic Details
Main Authors: Maximilian Zapf, Maurizio Ritzer, Lisa Liborius, Andreas Johannes, Martin Hafermann, Sven Schönherr, Jaime Segura-Ruiz, Gema Martínez-Criado, Werner Prost, Carsten Ronning
Format: article
Language:EN
Published: Nature Portfolio 2020
Subjects:
Q
Online Access:https://doaj.org/article/76e0867c35524acb9df7216ffe5817c9
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