Hot electrons in a nanowire hard X-ray detector
Designing efficient nanowire chip-based electrical and optical devices remains a challenge. Here, the authors present an axial p-n junction GaAs nanowire X-ray detector that enables achieving a spatial resolution of 200 nm; probing the internal electrical field and observing hot electron effects at...
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Autores principales: | Maximilian Zapf, Maurizio Ritzer, Lisa Liborius, Andreas Johannes, Martin Hafermann, Sven Schönherr, Jaime Segura-Ruiz, Gema Martínez-Criado, Werner Prost, Carsten Ronning |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2020
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Materias: | |
Acceso en línea: | https://doaj.org/article/76e0867c35524acb9df7216ffe5817c9 |
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