SAKAI, T., WAKAYAMA, S., KAMETANI, G., YOSHIDA, K., & AKATSU, T. (2014). Characterization of crack growth resistance under thermal shock on silicon nitride with various microstructure. The Japan Society of Mechanical Engineers.
Cita Chicago Style (17a ed.)SAKAI, Takenobu, Shuichi WAKAYAMA, Go KAMETANI, Katsumi YOSHIDA, y Takashi AKATSU. Characterization of Crack Growth Resistance Under Thermal Shock on Silicon Nitride with Various Microstructure. The Japan Society of Mechanical Engineers, 2014.
Cita MLA (8a ed.)SAKAI, Takenobu, et al. Characterization of Crack Growth Resistance Under Thermal Shock on Silicon Nitride with Various Microstructure. The Japan Society of Mechanical Engineers, 2014.
Precaución: Estas citas no son 100% exactas.