Characterization of crack growth resistance under thermal shock on silicon nitride with various microstructure

The crack growth resistance under thermal shock loading on silicon nitride was characterized using Disc-on-Rod test which was developed by the authors. The microdamage during thermal shock fracture was monitored by acoustic emission (AE) technique. Specimens were composed of β-Si3N4 with an acicular...

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Bibliographic Details
Main Authors: Takenobu SAKAI, Shuichi WAKAYAMA, Go KAMETANI, Katsumi YOSHIDA, Takashi AKATSU
Format: article
Language:EN
Published: The Japan Society of Mechanical Engineers 2014
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Online Access:https://doaj.org/article/7b4cea3acdf948d398b01a6f1bbf27e8
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