Adoption of the Wet Surface Treatment Technique for the Improvement of Device Performance of Enhancement-Mode AlGaN/GaN MOSHEMTs for Millimeter-Wave Applications

In this work, a low-power plasma oxidation surface treatment followed by Al<sub>2</sub>O<sub>3</sub> gate dielectric deposition technique is adopted to improve device performance of the enhancement-mode (E-mode) AlGaN/GaN metal-oxide-semiconductor high-electron-mobility trans...

Full description

Saved in:
Bibliographic Details
Main Authors: Chun Wang, Yu-Chiao Chen, Heng-Tung Hsu, Yi-Fan Tsao, Yueh-Chin Lin, Chang-Fu Dee, Edward-Yi Chang
Format: article
Language:EN
Published: MDPI AG 2021
Subjects:
GaN
T
Online Access:https://doaj.org/article/7bcdd89a3b7442a1b03c7416e12c81fa
Tags: Add Tag
No Tags, Be the first to tag this record!