Evolution of Metastable Defects and Its Effect on the Electronic Properties of MoS2 Films

Abstract We report on structural and electronic properties of defects in chemical vapor-deposited monolayer and few-layer MoS2 films. Scanning tunneling microscopy, Kelvin probe force microscopy, and transmission electron microscopy were used to obtain high resolution images and quantitative measure...

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Autores principales: M. Precner, T. Polaković, Qiao Qiao, D. J. Trainer, A. V. Putilov, C. Di Giorgio, I. Cone, Y. Zhu, X. X. Xi, M. Iavarone, G. Karapetrov
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
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Acceso en línea:https://doaj.org/article/7d8350d8507c4192a6070e81b6b1aab6
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