Correlating Time Series Signals and Event Logs in Embedded Systems

In many embedded systems, we face the problem of correlating signals characterising device operation (e.g., performance parameters, anomalies) with events describing internal device activities. This leads to the investigation of two types of data: time series, representing signal periodic samples in...

Description complète

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Kazimierz Krosman, Janusz Sosnowski
Format: article
Langue:EN
Publié: MDPI AG 2021
Sujets:
Accès en ligne:https://doaj.org/article/7f3016852ffb45d2a1a87499a238802e
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!