Effect of Probabilistic Similarity Measure on Metric-Based Few-Shot Classification
In developing a few-shot classification model using deep networks, the limited number of samples in each class causes difficulty in utilizing statistical characteristics of the class distributions. In this paper, we propose a method to treat this difficulty by combining a probabilistic similarity ba...
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| Auteurs principaux: | , |
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| Format: | article |
| Langue: | EN |
| Publié: |
MDPI AG
2021
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| Accès en ligne: | https://doaj.org/article/7f50fb27736747cb881c6b3232758cdb |
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