Effect of Probabilistic Similarity Measure on Metric-Based Few-Shot Classification

In developing a few-shot classification model using deep networks, the limited number of samples in each class causes difficulty in utilizing statistical characteristics of the class distributions. In this paper, we propose a method to treat this difficulty by combining a probabilistic similarity ba...

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Autores principales: Youngjae Lee, Hyeyoung Park
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/7f50fb27736747cb881c6b3232758cdb
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