Research on junction temperature detection method of power electronic devices based on turn-off time and turn-off loss
The temperature-sensitive electrical parameter (TSEP) method is widely used in the extraction and prediction of junction temperature (Tj) of power semiconductor devices. In this paper, turn-off loss (Eoff) and turn-off time (toff) are taken as temperature-sensitive electrical parameters. It is prove...
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| Autores principales: | , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Elsevier
2022
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/7fe15df1ab8547d091507b5ec19b253c |
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