An Early-Life NAND Flash Endurance Prediction System
NAND flash memory – ubiquitous in today’s world of smart phones, SSDs (solid state drives), and cloud storage – has a number of well-known reliability problems. NAND data contains bit errors, which require the use of error correcting codes (ECCs). The raw bit error r...
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| Main Authors: | , , |
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| Format: | article |
| Language: | EN |
| Published: |
IEEE
2021
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| Subjects: | |
| Online Access: | https://doaj.org/article/80274b70c9ca43afbe723930c694608e |
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