An Early-Life NAND Flash Endurance Prediction System
NAND flash memory – ubiquitous in today’s world of smart phones, SSDs (solid state drives), and cloud storage – has a number of well-known reliability problems. NAND data contains bit errors, which require the use of error correcting codes (ECCs). The raw bit error r...
Guardado en:
Autores principales: | Barry Fitzgerald, Conor Ryan, Joe Sullivan |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
IEEE
2021
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Materias: | |
Acceso en línea: | https://doaj.org/article/80274b70c9ca43afbe723930c694608e |
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