Single-shot Monitoring of Ultrafast Processes via X-ray Streaking at a Free Electron Laser

Abstract The advent of x-ray free electron lasers has extended the unique capabilities of resonant x-ray spectroscopy techniques to ultrafast time scales. Here, we report on a novel experimental method that allows retrieving with a single x-ray pulse the time evolution of an ultrafast process, not o...

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Autores principales: Michele Buzzi, Mikako Makita, Ludovic Howald, Armin Kleibert, Boris Vodungbo, Pablo Maldonado, Jörg Raabe, Nicolas Jaouen, Harald Redlin, Kai Tiedtke, Peter M. Oppeneer, Christian David, Frithjof Nolting, Jan Lüning
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/808baa3f823841bd96697911e838a496
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