Ion tracks in silicon formed by much lower energy deposition than the track formation threshold
Abstract Damaged regions of cylindrical shapes called ion tracks, typically in nano-meters wide and tens micro-meters long, are formed along the ion trajectories in many insulators, when high energy ions in the electronic stopping regime are injected. In most cases, the ion tracks were assumed as co...
Enregistré dans:
| Auteurs principaux: | , , , , , , , , , , |
|---|---|
| Format: | article |
| Langue: | EN |
| Publié: |
Nature Portfolio
2021
|
| Sujets: | |
| Accès en ligne: | https://doaj.org/article/823b375f8dfb4f7286f25bd8b1a1bf0a |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|