Adaptive Control of Ion Yield in Femtosecond Laser Post-ionization for Secondary Ion Mass Spectrometry

Abstract Secondary ion mass spectrometry is an excellent technique of analytical chemistry, where primary ions sputter a solid sample generating the secondary ions which are determined. Although the ion yield is inherently low, it can be enhanced by using a post-ionization of sputtered neutral speci...

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Autores principales: Dusan Lorenc, Monika Jerigova, Monika Stupavska, Dusan Velic
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/839e5dea7a92408ea53176c22da618c1
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