Electronic Band Alignment at Complex Oxide Interfaces Measured by Scanning Photocurrent Microscopy

Abstract The band alignment at an Al2O3/SrTiO3 heterointerface forming a two-dimensional electron gas (2DEG) was investigated using scanning photocurrent microscopy (SPCM) in an electrolyte-gated environment. We used a focused UV laser source for above-the-bandgap illumination on the SrTiO3 layer, c...

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Auteurs principaux: J. H. Yoon, H. J. Jung, J. T. Hong, Ji-Yong Park, Soonil Lee, S. W. Lee, Y. H. Ahn
Format: article
Langue:EN
Publié: Nature Portfolio 2017
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Accès en ligne:https://doaj.org/article/8418fa99bda8476cb1f9c4795cab38e9
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