Relationship between diffraction peak, network topology, and amorphous-forming ability in silicon and silica

Abstract The network topology in disordered materials is an important structural descriptor for understanding the nature of disorder that is usually hidden in pairwise correlations. Here, we compare the covalent network topology of liquid and solidified silicon (Si) with that of silica (SiO2) on the...

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Autores principales: Shinji Kohara, Motoki Shiga, Yohei Onodera, Hirokazu Masai, Akihiko Hirata, Motohiko Murakami, Tetsuya Morishita, Koji Kimura, Kouichi Hayashi
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/85a1e24fbce84eaa894e551addab5c25
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