Relationship between diffraction peak, network topology, and amorphous-forming ability in silicon and silica

Relationship between diffraction peak, network topology, and amorphous-forming ability in silicon and silica

Abstract The network topology in disordered materials is an important structural descriptor for understanding the nature of disorder that is usually hidden in pairwise correlations. Here, we compare the covalent network topology of liquid and solidified silicon (Si) with that of silica (SiO2) on the...

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Bibliographic Details
Main Authors: Shinji Kohara, Motoki Shiga, Yohei Onodera, Hirokazu Masai, Akihiko Hirata, Motohiko Murakami, Tetsuya Morishita, Koji Kimura, Kouichi Hayashi
Format: article
Language:EN
Published: Nature Portfolio 2021
Subjects:
Medicine
R
Science
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Online Access:https://doaj.org/article/85a1e24fbce84eaa894e551addab5c25
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https://doaj.org/article/85a1e24fbce84eaa894e551addab5c25

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