Relationship between diffraction peak, network topology, and amorphous-forming ability in silicon and silica

Abstract The network topology in disordered materials is an important structural descriptor for understanding the nature of disorder that is usually hidden in pairwise correlations. Here, we compare the covalent network topology of liquid and solidified silicon (Si) with that of silica (SiO2) on the...

Description complète

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Shinji Kohara, Motoki Shiga, Yohei Onodera, Hirokazu Masai, Akihiko Hirata, Motohiko Murakami, Tetsuya Morishita, Koji Kimura, Kouichi Hayashi
Format: article
Langue:EN
Publié: Nature Portfolio 2021
Sujets:
R
Q
Accès en ligne:https://doaj.org/article/85a1e24fbce84eaa894e551addab5c25
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!