Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials

Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real...

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Auteurs principaux: Amir Abdollahi, Neus Domingo, Irene Arias, Gustau Catalan
Format: article
Langue:EN
Publié: Nature Portfolio 2019
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Accès en ligne:https://doaj.org/article/873376c9ea4540e4ae55f707bc8d3174
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