Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials
Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real...
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Autores principales: | , , , |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
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Materias: | |
Acceso en línea: | https://doaj.org/article/873376c9ea4540e4ae55f707bc8d3174 |
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Sumario: | Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real signals. |
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