Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials

Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real...

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Autores principales: Amir Abdollahi, Neus Domingo, Irene Arias, Gustau Catalan
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/873376c9ea4540e4ae55f707bc8d3174
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Sumario:Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real signals.