Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS

This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve state-of-the-art immunity to Single-Event Effects (S...

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Autores principales: Stefan Biereigel, Szymon Kulis, Paulo Moreira, Alexander Kölpin, Paul Leroux, Jeffrey Prinzie
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
Materias:
PLL
CDR
Acceso en línea:https://doaj.org/article/876fa46e37a041b690ea5a9954a41008
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