Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS
This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve state-of-the-art immunity to Single-Event Effects (S...
Guardado en:
Autores principales: | , , , , , |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
MDPI AG
2021
|
Materias: | |
Acceso en línea: | https://doaj.org/article/876fa46e37a041b690ea5a9954a41008 |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
id |
oai:doaj.org-article:876fa46e37a041b690ea5a9954a41008 |
---|---|
record_format |
dspace |
spelling |
oai:doaj.org-article:876fa46e37a041b690ea5a9954a410082021-11-25T17:24:09ZRadiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS10.3390/electronics102227412079-9292https://doaj.org/article/876fa46e37a041b690ea5a9954a410082021-11-01T00:00:00Zhttps://www.mdpi.com/2079-9292/10/22/2741https://doaj.org/toc/2079-9292This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve state-of-the-art immunity to Single-Event Effects (SEEs) up to 62.5 MeV cm<sup>2</sup> mg<sup>−1</sup> as well as tolerance to the Total Ionizing Dose (TID) exceeding 1.5 Grad. The LC Digitally Controlled Oscillator (DCO) is implemented without MOS varactors, avoiding the use of a highly SEE sensitive circuit element. The circuit is designed to operate at reference clock frequencies from 40 MHz to 320 MHz or at data rates from 40 Mbps to 320 Mbps and displays a jitter performance of 520 fs with a power dissipation of only 11 mW and an FOM of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mo>−</mo><mn>235</mn></mrow></semantics></math></inline-formula> dB.Stefan BiereigelSzymon KulisPaulo MoreiraAlexander KölpinPaul LerouxJeffrey PrinzieMDPI AGarticleAll-DigitalPLLCDRSingle-Event Effectsradiation hardeningElectronicsTK7800-8360ENElectronics, Vol 10, Iss 2741, p 2741 (2021) |
institution |
DOAJ |
collection |
DOAJ |
language |
EN |
topic |
All-Digital PLL CDR Single-Event Effects radiation hardening Electronics TK7800-8360 |
spellingShingle |
All-Digital PLL CDR Single-Event Effects radiation hardening Electronics TK7800-8360 Stefan Biereigel Szymon Kulis Paulo Moreira Alexander Kölpin Paul Leroux Jeffrey Prinzie Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS |
description |
This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve state-of-the-art immunity to Single-Event Effects (SEEs) up to 62.5 MeV cm<sup>2</sup> mg<sup>−1</sup> as well as tolerance to the Total Ionizing Dose (TID) exceeding 1.5 Grad. The LC Digitally Controlled Oscillator (DCO) is implemented without MOS varactors, avoiding the use of a highly SEE sensitive circuit element. The circuit is designed to operate at reference clock frequencies from 40 MHz to 320 MHz or at data rates from 40 Mbps to 320 Mbps and displays a jitter performance of 520 fs with a power dissipation of only 11 mW and an FOM of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mo>−</mo><mn>235</mn></mrow></semantics></math></inline-formula> dB. |
format |
article |
author |
Stefan Biereigel Szymon Kulis Paulo Moreira Alexander Kölpin Paul Leroux Jeffrey Prinzie |
author_facet |
Stefan Biereigel Szymon Kulis Paulo Moreira Alexander Kölpin Paul Leroux Jeffrey Prinzie |
author_sort |
Stefan Biereigel |
title |
Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS |
title_short |
Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS |
title_full |
Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS |
title_fullStr |
Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS |
title_full_unstemmed |
Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS |
title_sort |
radiation-tolerant all-digital pll/cdr with varactorless lc dco in 65 nm cmos |
publisher |
MDPI AG |
publishDate |
2021 |
url |
https://doaj.org/article/876fa46e37a041b690ea5a9954a41008 |
work_keys_str_mv |
AT stefanbiereigel radiationtolerantalldigitalpllcdrwithvaractorlesslcdcoin65nmcmos AT szymonkulis radiationtolerantalldigitalpllcdrwithvaractorlesslcdcoin65nmcmos AT paulomoreira radiationtolerantalldigitalpllcdrwithvaractorlesslcdcoin65nmcmos AT alexanderkolpin radiationtolerantalldigitalpllcdrwithvaractorlesslcdcoin65nmcmos AT paulleroux radiationtolerantalldigitalpllcdrwithvaractorlesslcdcoin65nmcmos AT jeffreyprinzie radiationtolerantalldigitalpllcdrwithvaractorlesslcdcoin65nmcmos |
_version_ |
1718412419356688384 |