Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer
GaN-based green light-emitting diodes (LEDs) with different thicknesses of the low-temperature (LT) p-GaN layer between the last GaN barriers and p-AlGaN electron blocking layer were characterized by photoluminescence (PL) and electroluminescence (EL) spectroscopic methods in the temperature range o...
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MDPI AG
2021
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oai:doaj.org-article:882077be7b524a95a011fa668b83aa8f2021-11-25T18:32:43ZOptical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer10.3390/nano111131342079-4991https://doaj.org/article/882077be7b524a95a011fa668b83aa8f2021-11-01T00:00:00Zhttps://www.mdpi.com/2079-4991/11/11/3134https://doaj.org/toc/2079-4991GaN-based green light-emitting diodes (LEDs) with different thicknesses of the low-temperature (LT) p-GaN layer between the last GaN barriers and p-AlGaN electron blocking layer were characterized by photoluminescence (PL) and electroluminescence (EL) spectroscopic methods in the temperature range of 6–300 K and injection current range of 0.01–350 mA. Based on the results, we suggest that a 20 nm-thick LT p-GaN layer can effectively prevent indium (In) re-evaporation, improve the quantum-confined Stark effect in the last quantum well (QW) of the active region, and finally reduce the efficiency droop by about 7%.Jianfei LiDuo ChenKuilong LiQiang WangMengyao ShiDejie DiaoChen ChengChangfu LiJiancai LengMDPI AGarticleInGaN/GaN multiple quantum welllow-temperature p-GaN layerphotoluminescenceelectroluminescencelocalization effectChemistryQD1-999ENNanomaterials, Vol 11, Iss 3134, p 3134 (2021) |
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DOAJ |
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topic |
InGaN/GaN multiple quantum well low-temperature p-GaN layer photoluminescence electroluminescence localization effect Chemistry QD1-999 |
spellingShingle |
InGaN/GaN multiple quantum well low-temperature p-GaN layer photoluminescence electroluminescence localization effect Chemistry QD1-999 Jianfei Li Duo Chen Kuilong Li Qiang Wang Mengyao Shi Dejie Diao Chen Cheng Changfu Li Jiancai Leng Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer |
description |
GaN-based green light-emitting diodes (LEDs) with different thicknesses of the low-temperature (LT) p-GaN layer between the last GaN barriers and p-AlGaN electron blocking layer were characterized by photoluminescence (PL) and electroluminescence (EL) spectroscopic methods in the temperature range of 6–300 K and injection current range of 0.01–350 mA. Based on the results, we suggest that a 20 nm-thick LT p-GaN layer can effectively prevent indium (In) re-evaporation, improve the quantum-confined Stark effect in the last quantum well (QW) of the active region, and finally reduce the efficiency droop by about 7%. |
format |
article |
author |
Jianfei Li Duo Chen Kuilong Li Qiang Wang Mengyao Shi Dejie Diao Chen Cheng Changfu Li Jiancai Leng |
author_facet |
Jianfei Li Duo Chen Kuilong Li Qiang Wang Mengyao Shi Dejie Diao Chen Cheng Changfu Li Jiancai Leng |
author_sort |
Jianfei Li |
title |
Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer |
title_short |
Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer |
title_full |
Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer |
title_fullStr |
Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer |
title_full_unstemmed |
Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer |
title_sort |
optical properties of gan-based green light-emitting diodes influenced by low-temperature p-gan layer |
publisher |
MDPI AG |
publishDate |
2021 |
url |
https://doaj.org/article/882077be7b524a95a011fa668b83aa8f |
work_keys_str_mv |
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1718411029295136768 |