Optical Properties of GaN-Based Green Light-Emitting Diodes Influenced by Low-Temperature p-GaN Layer
GaN-based green light-emitting diodes (LEDs) with different thicknesses of the low-temperature (LT) p-GaN layer between the last GaN barriers and p-AlGaN electron blocking layer were characterized by photoluminescence (PL) and electroluminescence (EL) spectroscopic methods in the temperature range o...
Enregistré dans:
Auteurs principaux: | Jianfei Li, Duo Chen, Kuilong Li, Qiang Wang, Mengyao Shi, Dejie Diao, Chen Cheng, Changfu Li, Jiancai Leng |
---|---|
Format: | article |
Langue: | EN |
Publié: |
MDPI AG
2021
|
Sujets: | |
Accès en ligne: | https://doaj.org/article/882077be7b524a95a011fa668b83aa8f |
Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|
Documents similaires
-
Reverse Leakage Analysis for As-Grown and Regrown Vertical GaN-on-GaN Schottky Barrier Diodes
par: Kai Fu, et autres
Publié: (2020) -
Improvement of interface morphology and luminescence properties of InGaN/GaN multiple quantum wells by thermal annealing treatment
par: Yufei Hou, et autres
Publié: (2021) -
Normally-off p-GaN Gated AlGaN/GaN HEMTs Using Plasma Oxidation Technique in Access Region
par: Xinke Liu, et autres
Publié: (2020) -
Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT
par: Martin Florovič, et autres
Publié: (2021) -
Impact of process-dependent SiNx passivation on proton-induced degradation in GaN MIS-HEMTs
par: Young Jun Yoon, et autres
Publié: (2021)