Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.

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Autores principales: Jörg S. Eismann, Martin Neugebauer, Klaus Mantel, Peter Banzer
Formato: article
Lenguaje:EN
Publicado: Nature Publishing Group 2021
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Acceso en línea:https://doaj.org/article/8a56b8823bff487f92db363e29c118e1
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