Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.

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Autores principales:	Jörg S. Eismann, Martin Neugebauer, Klaus Mantel, Peter Banzer
Formato:	article
Lenguaje:	EN
Publicado:	Nature Publishing Group 2021
Materias:	Applied optics. Photonics TA1501-1820 Optics. Light QC350-467
Acceso en línea:	https://doaj.org/article/8a56b8823bff487f92db363e29c118e1
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spelling	oai:doaj.org-article:8a56b8823bff487f92db363e29c118e12021-11-08T10:57:45ZAbsolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer10.1038/s41377-021-00663-x2047-7538https://doaj.org/article/8a56b8823bff487f92db363e29c118e12021-11-01T00:00:00Zhttps://doi.org/10.1038/s41377-021-00663-xhttps://doaj.org/toc/2047-7538An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.Jörg S. EismannMartin NeugebauerKlaus MantelPeter BanzerNature Publishing GrouparticleApplied optics. PhotonicsTA1501-1820Optics. LightQC350-467ENLight: Science & Applications, Vol 10, Iss 1, Pp 1-7 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Applied optics. Photonics TA1501-1820 Optics. Light QC350-467
spellingShingle	Applied optics. Photonics TA1501-1820 Optics. Light QC350-467 Jörg S. Eismann Martin Neugebauer Klaus Mantel Peter Banzer Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
description	An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.
format	article
author	Jörg S. Eismann Martin Neugebauer Klaus Mantel Peter Banzer
author_facet	Jörg S. Eismann Martin Neugebauer Klaus Mantel Peter Banzer
author_sort	Jörg S. Eismann
title	Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
title_short	Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
title_full	Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
title_fullStr	Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
title_full_unstemmed	Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
title_sort	absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
publisher	Nature Publishing Group
publishDate	2021
url	https://doaj.org/article/8a56b8823bff487f92db363e29c118e1
work_keys_str_mv	AT jorgseismann absolutecharacterizationofhighnumericalaperturemicroscopeobjectivesutilizingadipolescatterer AT martinneugebauer absolutecharacterizationofhighnumericalaperturemicroscopeobjectivesutilizingadipolescatterer AT klausmantel absolutecharacterizationofhighnumericalaperturemicroscopeobjectivesutilizingadipolescatterer AT peterbanzer absolutecharacterizationofhighnumericalaperturemicroscopeobjectivesutilizingadipolescatterer
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Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer

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