Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Publishing Group
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/8a56b8823bff487f92db363e29c118e1 |
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