Annealing Studies of Copper Indium Oxide (Cu<sub>2</sub>In<sub>2</sub>O<sub>5</sub>) Thin Films Prepared by RF Magnetron Sputtering

Copper indium oxide (Cu<sub>2</sub>In<sub>2</sub>O<sub>5</sub>) thin films were deposited by the RF magnetron sputtering technique using a Cu<sub>2</sub>O:In<sub>2</sub>O<sub>3</sub> target. The films were deposited on glass and...

Description complète

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Giji Skaria, Ashwin Kumar Saikumar, Akshaya D. Shivprasad, Kalpathy B. Sundaram
Format: article
Langue:EN
Publié: MDPI AG 2021
Sujets:
XRD
Accès en ligne:https://doaj.org/article/8de0c8eb5ee8471fa6b48f02c8cb33c0
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!