Cita APA (7a ed.)

Yoon, Y. J., Lee, J. S., Kang, I. M., Lee, E. J., & Kim, D. (2021). Impact of process-dependent SiNx passivation on proton-induced degradation in GaN MIS-HEMTs. Elsevier.

Cita Chicago Style (17a ed.)

Yoon, Young Jun, Jae Sang Lee, In Man Kang, Eun Je Lee, y Dong-Seok Kim. Impact of Process-dependent SiNx Passivation on Proton-induced Degradation in GaN MIS-HEMTs. Elsevier, 2021.

Cita MLA (8a ed.)

Yoon, Young Jun, et al. Impact of Process-dependent SiNx Passivation on Proton-induced Degradation in GaN MIS-HEMTs. Elsevier, 2021.