Spheroidization Behavior of Nano-Primary Silicon Induced by Neodymium under High-Current Pulsed Electron Beam Irradiation
The spheroidization behavior of the nano-primary silicon phase induced by Nd under high-current pulsed electron beam (HCPEB) irradiation was investigated in this study. The study results revealed that, compared to the Al–17.5Si alloy, spheroidized nano-primary silicon phase emerged in the alloy’s HC...
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| Autores principales: | , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
MDPI AG
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/9b2d59950605411ea86b9857a17e9ffc |
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