Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam Irradiation
A correlation coefficient is often used as a measure of the strength of a linear relationship (i.e., the degree of similarity) between two sets of data in a variety of fields. However, in the field of scanning electron microscopy (SEM), it is frequently difficult to properly use the correlation coef...
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| Autores principales: | , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Hindawi-Wiley
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/9f6119a750244c8785e63f51a84ce436 |
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