One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is built by considering one cut-point in the non-negative semi-line of a phase-type distribution. The density function is de...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | article |
| Language: | EN |
| Published: |
MDPI AG
2021
|
| Subjects: | |
| Online Access: | https://doaj.org/article/a2ed05cff89d4fb18b1f15fea8c0a949 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|