Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings
Abstract While terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs < < 1 mS, remains elusive. This is primarily due to the low sensitivi...
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| Autores principales: | , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/a4589a3ccd4441cdb73ecf0f82003403 |
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