Hiller, D., López-Vidrier, J., Gutsch, S., Zacharias, M., Wahl, M., Bock, W., . . . König, D. (2017). Boron-Incorporating Silicon Nanocrystals Embedded in SiO2: Absence of Free Carriers vs. B-Induced Defects. Nature Portfolio.
Cita Chicago Style (17a ed.)Hiller, Daniel, et al. Boron-Incorporating Silicon Nanocrystals Embedded in SiO2: Absence of Free Carriers Vs. B-Induced Defects. Nature Portfolio, 2017.
Cita MLA (8a ed.)Hiller, Daniel, et al. Boron-Incorporating Silicon Nanocrystals Embedded in SiO2: Absence of Free Carriers Vs. B-Induced Defects. Nature Portfolio, 2017.
Precaución: Estas citas no son 100% exactas.