Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

We propose a new method to determine the absolute structure of chiral crystals, which is based on the chiral asymmetry of multiple scattering diffraction. It manifests as a difference in the azimuthal dependence of the forbidden Bragg reflection intensity measured with left and right circularly pola...

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Detalles Bibliográficos
Autores principales: Ksenia Kozlovskaya, Elena Ovchinnikova, Jun Kokubun, Andrei Rogalev, Fabrice Wilhelm, Francois Guillou, Francois de Bergevin, Alisa F. Konstantinova, Vladimir E. Dmitrienko
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
Materias:
chirality
many-wave X-ray diffraction
renninger scan
Crystallography
QD901-999
Acceso en línea:https://doaj.org/article/ab9d5427bc034d8485855e487a81fb8e
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https://doaj.org/article/ab9d5427bc034d8485855e487a81fb8e

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