Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads

Radio frequency-microelectromechanical system (RF-MEMS) switches, which use physical Ohmic contacts, are recently focused for high performance in the high-frequency ranges. Typically, the contact areas of the electrodes in RF-MEMS switches are less than 0.01 mm2, and they generate just very low norm...

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Autores principales: Yusuke YUKIYOSHI, Yuma YOKOI, Hiroshi KINOSHITA, Masahiro FUJII
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Lenguaje:EN
Publicado: The Japan Society of Mechanical Engineers 2016
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spelling oai:doaj.org-article:b2e1e7982cc0458dacf25255834409a02021-11-26T06:55:31ZElectrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads2187-974510.1299/mej.15-00346https://doaj.org/article/b2e1e7982cc0458dacf25255834409a02016-09-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/mej/3/5/3_15-00346/_pdf/-char/enhttps://doaj.org/toc/2187-9745Radio frequency-microelectromechanical system (RF-MEMS) switches, which use physical Ohmic contacts, are recently focused for high performance in the high-frequency ranges. Typically, the contact areas of the electrodes in RF-MEMS switches are less than 0.01 mm2, and they generate just very low normal loads of less than 1 mN. The limited real contact area of the electrodes leads to high electrical contact resistances and wear on the switches. Carbon nanotube (CNT) films, formed with many vertically aligned CNTs on a silicon substrate, are one candidate electrode material for RF-MEMS switches. However, CNT films have a high electrical contact resistance with metals. In this study, precious-metal electroplating (Ag, Au, Pt, Rh, and Cu) on CNT films was performed to decrease the electrical contact resistances of the films and increase their wear resistances. The contact resistances of the electroplated CNT films as a function of normal loads up to 1 mN were measured by φ2 mm Cu balls. In this study, the Ag-electroplated CNT film with a hydrogen annealing had the lowest electrical contact resistance of 0.10 Ω. Durability experiments of cyclic connection switching were conducted under direct applied voltages of 3 V or 10 V between the films and Cu balls, and with a load of 1 mN for 3 × 105 cycles. The electrical contact resistance of the Ag-electroplated CNT film with the hydrogen annealing was stable during this durability experiment.Yusuke YUKIYOSHIYuma YOKOIHiroshi KINOSHITAMasahiro FUJIIThe Japan Society of Mechanical Engineersarticlecarbon nanotubecnt filmelectrical contact resistancerf-memselectroplatingMechanical engineering and machineryTJ1-1570ENMechanical Engineering Journal, Vol 3, Iss 5, Pp 15-00346-15-00346 (2016)
institution DOAJ
collection DOAJ
language EN
topic carbon nanotube
cnt film
electrical contact resistance
rf-mems
electroplating
Mechanical engineering and machinery
TJ1-1570
spellingShingle carbon nanotube
cnt film
electrical contact resistance
rf-mems
electroplating
Mechanical engineering and machinery
TJ1-1570
Yusuke YUKIYOSHI
Yuma YOKOI
Hiroshi KINOSHITA
Masahiro FUJII
Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
description Radio frequency-microelectromechanical system (RF-MEMS) switches, which use physical Ohmic contacts, are recently focused for high performance in the high-frequency ranges. Typically, the contact areas of the electrodes in RF-MEMS switches are less than 0.01 mm2, and they generate just very low normal loads of less than 1 mN. The limited real contact area of the electrodes leads to high electrical contact resistances and wear on the switches. Carbon nanotube (CNT) films, formed with many vertically aligned CNTs on a silicon substrate, are one candidate electrode material for RF-MEMS switches. However, CNT films have a high electrical contact resistance with metals. In this study, precious-metal electroplating (Ag, Au, Pt, Rh, and Cu) on CNT films was performed to decrease the electrical contact resistances of the films and increase their wear resistances. The contact resistances of the electroplated CNT films as a function of normal loads up to 1 mN were measured by φ2 mm Cu balls. In this study, the Ag-electroplated CNT film with a hydrogen annealing had the lowest electrical contact resistance of 0.10 Ω. Durability experiments of cyclic connection switching were conducted under direct applied voltages of 3 V or 10 V between the films and Cu balls, and with a load of 1 mN for 3 × 105 cycles. The electrical contact resistance of the Ag-electroplated CNT film with the hydrogen annealing was stable during this durability experiment.
format article
author Yusuke YUKIYOSHI
Yuma YOKOI
Hiroshi KINOSHITA
Masahiro FUJII
author_facet Yusuke YUKIYOSHI
Yuma YOKOI
Hiroshi KINOSHITA
Masahiro FUJII
author_sort Yusuke YUKIYOSHI
title Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
title_short Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
title_full Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
title_fullStr Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
title_full_unstemmed Electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
title_sort electrical contact resistance performance of precious-metal-electroplated carbon nanotube films under micro loads
publisher The Japan Society of Mechanical Engineers
publishDate 2016
url https://doaj.org/article/b2e1e7982cc0458dacf25255834409a0
work_keys_str_mv AT yusukeyukiyoshi electricalcontactresistanceperformanceofpreciousmetalelectroplatedcarbonnanotubefilmsundermicroloads
AT yumayokoi electricalcontactresistanceperformanceofpreciousmetalelectroplatedcarbonnanotubefilmsundermicroloads
AT hiroshikinoshita electricalcontactresistanceperformanceofpreciousmetalelectroplatedcarbonnanotubefilmsundermicroloads
AT masahirofujii electricalcontactresistanceperformanceofpreciousmetalelectroplatedcarbonnanotubefilmsundermicroloads
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