High-quality AlN grown with a single substrate temperature below 1200 °C
Abstract 1.5-μm AlN grown by metal-organic chemical vapor deposition (MOCVD), with a single substrate temperature of 1180 °C, exhibits atomically flat surface and the XRD (102) peak width of 427 arcsec. The results are achieved with a pulsed NH3-flow condition, serving as an alternative for the comm...
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Nature Portfolio
2017
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oai:doaj.org-article:b393a420061f4e99ae006e9367826f162021-12-02T15:06:08ZHigh-quality AlN grown with a single substrate temperature below 1200 °C10.1038/s41598-017-07616-82045-2322https://doaj.org/article/b393a420061f4e99ae006e9367826f162017-08-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-07616-8https://doaj.org/toc/2045-2322Abstract 1.5-μm AlN grown by metal-organic chemical vapor deposition (MOCVD), with a single substrate temperature of 1180 °C, exhibits atomically flat surface and the XRD (102) peak width of 427 arcsec. The results are achieved with a pulsed NH3-flow condition, serving as an alternative for the commonly used temperature-varied buffer structure, which is often complicated and time-consuming. Inserting two pulsed-NH3-flow AlN layers in the epitaxial structure not only releases the lattice strain via the formation of three-dimensional nano-islands, but also smoothens the surface with prolonged lateral migration of Al adatoms. This effective growth technique substantially simplifies the manufacture of device-quality AlN.Chun-Pin HuangKapil GuptaChao-Hung WangChuan-Pu LiuKun-Yu LaiNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-6 (2017) |
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Medicine R Science Q Chun-Pin Huang Kapil Gupta Chao-Hung Wang Chuan-Pu Liu Kun-Yu Lai High-quality AlN grown with a single substrate temperature below 1200 °C |
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Abstract 1.5-μm AlN grown by metal-organic chemical vapor deposition (MOCVD), with a single substrate temperature of 1180 °C, exhibits atomically flat surface and the XRD (102) peak width of 427 arcsec. The results are achieved with a pulsed NH3-flow condition, serving as an alternative for the commonly used temperature-varied buffer structure, which is often complicated and time-consuming. Inserting two pulsed-NH3-flow AlN layers in the epitaxial structure not only releases the lattice strain via the formation of three-dimensional nano-islands, but also smoothens the surface with prolonged lateral migration of Al adatoms. This effective growth technique substantially simplifies the manufacture of device-quality AlN. |
format |
article |
author |
Chun-Pin Huang Kapil Gupta Chao-Hung Wang Chuan-Pu Liu Kun-Yu Lai |
author_facet |
Chun-Pin Huang Kapil Gupta Chao-Hung Wang Chuan-Pu Liu Kun-Yu Lai |
author_sort |
Chun-Pin Huang |
title |
High-quality AlN grown with a single substrate temperature below 1200 °C |
title_short |
High-quality AlN grown with a single substrate temperature below 1200 °C |
title_full |
High-quality AlN grown with a single substrate temperature below 1200 °C |
title_fullStr |
High-quality AlN grown with a single substrate temperature below 1200 °C |
title_full_unstemmed |
High-quality AlN grown with a single substrate temperature below 1200 °C |
title_sort |
high-quality aln grown with a single substrate temperature below 1200 °c |
publisher |
Nature Portfolio |
publishDate |
2017 |
url |
https://doaj.org/article/b393a420061f4e99ae006e9367826f16 |
work_keys_str_mv |
AT chunpinhuang highqualityalngrownwithasinglesubstratetemperaturebelow1200c AT kapilgupta highqualityalngrownwithasinglesubstratetemperaturebelow1200c AT chaohungwang highqualityalngrownwithasinglesubstratetemperaturebelow1200c AT chuanpuliu highqualityalngrownwithasinglesubstratetemperaturebelow1200c AT kunyulai highqualityalngrownwithasinglesubstratetemperaturebelow1200c |
_version_ |
1718388604765470720 |