High-quality AlN grown with a single substrate temperature below 1200 °C

Abstract 1.5-μm AlN grown by metal-organic chemical vapor deposition (MOCVD), with a single substrate temperature of 1180 °C, exhibits atomically flat surface and the XRD (102) peak width of 427 arcsec. The results are achieved with a pulsed NH3-flow condition, serving as an alternative for the comm...

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Autores principales: Chun-Pin Huang, Kapil Gupta, Chao-Hung Wang, Chuan-Pu Liu, Kun-Yu Lai
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Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/b393a420061f4e99ae006e9367826f16
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spelling oai:doaj.org-article:b393a420061f4e99ae006e9367826f162021-12-02T15:06:08ZHigh-quality AlN grown with a single substrate temperature below 1200 °C10.1038/s41598-017-07616-82045-2322https://doaj.org/article/b393a420061f4e99ae006e9367826f162017-08-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-07616-8https://doaj.org/toc/2045-2322Abstract 1.5-μm AlN grown by metal-organic chemical vapor deposition (MOCVD), with a single substrate temperature of 1180 °C, exhibits atomically flat surface and the XRD (102) peak width of 427 arcsec. The results are achieved with a pulsed NH3-flow condition, serving as an alternative for the commonly used temperature-varied buffer structure, which is often complicated and time-consuming. Inserting two pulsed-NH3-flow AlN layers in the epitaxial structure not only releases the lattice strain via the formation of three-dimensional nano-islands, but also smoothens the surface with prolonged lateral migration of Al adatoms. This effective growth technique substantially simplifies the manufacture of device-quality AlN.Chun-Pin HuangKapil GuptaChao-Hung WangChuan-Pu LiuKun-Yu LaiNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-6 (2017)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Chun-Pin Huang
Kapil Gupta
Chao-Hung Wang
Chuan-Pu Liu
Kun-Yu Lai
High-quality AlN grown with a single substrate temperature below 1200 °C
description Abstract 1.5-μm AlN grown by metal-organic chemical vapor deposition (MOCVD), with a single substrate temperature of 1180 °C, exhibits atomically flat surface and the XRD (102) peak width of 427 arcsec. The results are achieved with a pulsed NH3-flow condition, serving as an alternative for the commonly used temperature-varied buffer structure, which is often complicated and time-consuming. Inserting two pulsed-NH3-flow AlN layers in the epitaxial structure not only releases the lattice strain via the formation of three-dimensional nano-islands, but also smoothens the surface with prolonged lateral migration of Al adatoms. This effective growth technique substantially simplifies the manufacture of device-quality AlN.
format article
author Chun-Pin Huang
Kapil Gupta
Chao-Hung Wang
Chuan-Pu Liu
Kun-Yu Lai
author_facet Chun-Pin Huang
Kapil Gupta
Chao-Hung Wang
Chuan-Pu Liu
Kun-Yu Lai
author_sort Chun-Pin Huang
title High-quality AlN grown with a single substrate temperature below 1200 °C
title_short High-quality AlN grown with a single substrate temperature below 1200 °C
title_full High-quality AlN grown with a single substrate temperature below 1200 °C
title_fullStr High-quality AlN grown with a single substrate temperature below 1200 °C
title_full_unstemmed High-quality AlN grown with a single substrate temperature below 1200 °C
title_sort high-quality aln grown with a single substrate temperature below 1200 °c
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/b393a420061f4e99ae006e9367826f16
work_keys_str_mv AT chunpinhuang highqualityalngrownwithasinglesubstratetemperaturebelow1200c
AT kapilgupta highqualityalngrownwithasinglesubstratetemperaturebelow1200c
AT chaohungwang highqualityalngrownwithasinglesubstratetemperaturebelow1200c
AT chuanpuliu highqualityalngrownwithasinglesubstratetemperaturebelow1200c
AT kunyulai highqualityalngrownwithasinglesubstratetemperaturebelow1200c
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