Nonideal resistive and synaptic characteristics in Ag/ZnO/TiN device for neuromorphic system

Abstract Ideal resistive switching in resistive random-access memory (RRAM) should be ensured for synaptic devices in neuromorphic systems. We used an Ag/ZnO/TiN RRAM structure to investigate the effects of nonideal resistive switching, such as an unstable high-resistance state (HRS), negative set (...

Full description

Saved in:
Bibliographic Details
Main Authors: Jongmin Park, Hojeong Ryu, Sungjun Kim
Format: article
Language:EN
Published: Nature Portfolio 2021
Subjects:
R
Q
Online Access:https://doaj.org/article/bcc234de557b4533a6e87fde26960ef6
Tags: Add Tag
No Tags, Be the first to tag this record!