Efficient Ohmic contacts and built-in atomic sublayer protection in MoSi2N4 and WSi2N4 monolayers

Abstract Metal contacts to two-dimensional (2D) semiconductors are often plagued by the strong Fermi level pinning (FLP) effect which reduces the tunability of the Schottky barrier height (SBH) and degrades the performance of 2D semiconductor devices. Here, we show that MoSi2N4 and WSi2N4 monolayers...

Description complète

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Qianqian Wang, Liemao Cao, Shi-Jun Liang, Weikang Wu, Guangzhao Wang, Ching Hua Lee, Wee Liat Ong, Hui Ying Yang, Lay Kee Ang, Shengyuan A. Yang, Yee Sin Ang
Format: article
Langue:EN
Publié: Nature Portfolio 2021
Sujets:
Accès en ligne:https://doaj.org/article/c8b870b44a754a1e87a0105e5be39dbb
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!