Deep learning ferroelectric polarization distributions from STEM data via with and without atom finding

Abstract Over the last decade, scanning transmission electron microscopy (STEM) has emerged as a powerful tool for probing atomic structures of complex materials with picometer precision, opening the pathway toward exploring ferroelectric, ferroelastic, and chemical phenomena on the atomic scale. An...

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Auteurs principaux: Christopher T. Nelson, Ayana Ghosh, Mark Oxley, Xiaohang Zhang, Maxim Ziatdinov, Ichiro Takeuchi, Sergei V. Kalinin
Format: article
Langue:EN
Publié: Nature Portfolio 2021
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Accès en ligne:https://doaj.org/article/cc3e9a82689c4472ba644777e5a547c8
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